DFT insert的时候出现unmmaped cell的问题
insert_dft
Warning: The following synthetic libraries should be added to
the list of link libraries:
'dw_foundation.sldb'. (UISN-26)
Error: DFT insertion isn't supported on designs with unmapped cells. (TEST-269)
Information: Scan routing is not complete. Signals 'serial or scan_enables' need to be routed. (TEST-899)
Information: DFT insertion was not successful. There were unrecoverable processing errors. (TEST-211)
0
请问一下，可能是designware library不齐全的问题吗?本人没有对dont_use做setting的动作。
会不会是用了一些应该dont use的cell导致的，我也就是猜一猜。
把这个 dw_foundation.sldb 加到 link_library
看起来不行：insert_dft
Warning: Main library 'dw_foundation.sldb' has no time units specified, but library 'ua11lscep15bdrll_135c125_wc' does. (TIM-107)
Warning: Main library 'dw_foundation.sldb' has no capacitance units specified, but library 'ua11lscep15bdrll_135c125_wc' does. (TIM-108)
Warning: The trip points for the library named ua11lscep15bdrll_135c125_wc differ from those in the library named dw_foundation.sldb. (TIM-164)
Error: DFT insertion isn't supported on designs with unmapped cells. (TEST-269)
Information: Scan routing is not complete. Signals 'serial or scan_enables' need to be routed. (TEST-899)
Information: DFT insertion was not successful. There were unrecoverable processing errors. (TEST-211)
0
不过我在跑完synthesis之后，read_ddc，再insert_dft，却可以继续执行，直到write netlist:
dc_shell> source read_ddc.tcl
...
Reading ddc file 'ATM_TOP.ddc'.
Information: Checking out the license 'DesignWare'. (SEC-104)
Loaded 32 designs.
Current design is 'ATM_TOP'.
...
dc_shell> insert_dft
Routing Clock gating cells
Information: Routing clock gating cell test pins with no specified driver to scan enable 'TEST_SE'
Warning: Protocol generated after insertion in Internal Pins Flow is not accurate and can not be used. (TESTXG-53)
1
set link_library " $link_library dw_foundation.sldb" 这样就好了 不要放最前面
非常感谢这个建议，而且确实fix了之前的那个Warning：
#-------------------------------------------------------------------------------
# *. Insert DFT
#-------------------------------------------------------------------------------
set test_scan_enable_port_naming_style TESE_SE%s
TESE_SE%s
set_dft_signal -view existing_dft -port TEST_SE -type ScanEnable -active_state 1
Accepted dft signal specification for modes: all_dft
1
set_dft_drc_configuration -internal_pin enable
Accepted dft drc configuration specification.
1
set_dft_insertion_configuration -preserve_design_name true
Accepted insert_dft configuration specification.
1
set_dft_configuration -scan disable -connect_clock_gating enable
Accepted dft configuration specification.
1
insert_dft
Error: DFT insertion isn't supported on designs with unmapped cells. (TEST-269)
Information: Scan routing is not complete. Signals 'serial or scan_enables' need to be routed. (TEST-899)
Information: DFT insertion was not successful. There were unrecoverable processing errors. (TEST-211)
0
但是这个error仍然存在，不知有没好的建议?
你先做综合，综合之后再插scan