testing varactor
时间：04-09
整理：3721RD
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hi I have a problem in on-wafer varactor testing.
While I use vna to test c-v curve of varactor, turning on and off the lasar beam of microscope affect the c-v curve severely(freq:100MHz-20GHz, GSG probe with biasT). While using the LCR meter(freq:1MHz, DC Probe), no difference is observed. Can anyone give me some hints?
While I use vna to test c-v curve of varactor, turning on and off the lasar beam of microscope affect the c-v curve severely(freq:100MHz-20GHz, GSG probe with biasT). While using the LCR meter(freq:1MHz, DC Probe), no difference is observed. Can anyone give me some hints?
This happened due to the photosensitive properties of he junction.
Just do no use the microscope during C/V characterization and will fix the problem.
that makes sense:D thx