帮忙下几篇文章，谢谢！
时间：12-12
整理：3721RD
点击：
1. Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage
http://ieeexplore.ieee.org/Xplore/login.jsp?url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F7356%2F19955%2F00922910.pdf%3Farnumber%3D922910&authDecision=-203
2. Dynamic Turn-On Mechanism of the n-MOSFET Under High-Current Stress
http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4571143
3. The dynamic thermal behavior of silicided polysilicon under hight current stress event
http://ieeexplore.ieee.org/Xplore/login.jsp?url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F5164157%2F5173200%2F05173367.pdf%3Farnumber%3D5173367&authDecision=-203
http://ieeexplore.ieee.org/Xplore/login.jsp?url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F7356%2F19955%2F00922910.pdf%3Farnumber%3D922910&authDecision=-203
2. Dynamic Turn-On Mechanism of the n-MOSFET Under High-Current Stress
http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4571143
3. The dynamic thermal behavior of silicided polysilicon under hight current stress event
http://ieeexplore.ieee.org/Xplore/login.jsp?url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F5164157%2F5173200%2F05173367.pdf%3Farnumber%3D5173367&authDecision=-203
see att.