evm nervous
时间：04-10
整理：3721RD
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In wireless communications semiconductor manufacturing, ther eis a growing problem. The costs of final testing of RF semiconductor devices for communications is becoming a major part of the overall semiconductor manufacturing process.
Quantitatively, it is assumed that system-level testing can be traced back to fundamental tests, but people are not buying into it completely because there has been no proof put forward mathematically and this makes the designers weary and nervous.
The concept here is that a few EVM (Error Vector Magnitude) measurements, or more appropriately, modulation property measurements can be used in place of doing all of teh fundamental measurements liek phase noise, IP3, noise figure, etc. In theory, the modulation measurements will take less time (i.e., less money) and give more information.
Does anyone know of any papers or research going on toward proving this?
Quantitatively, it is assumed that system-level testing can be traced back to fundamental tests, but people are not buying into it completely because there has been no proof put forward mathematically and this makes the designers weary and nervous.
The concept here is that a few EVM (Error Vector Magnitude) measurements, or more appropriately, modulation property measurements can be used in place of doing all of teh fundamental measurements liek phase noise, IP3, noise figure, etc. In theory, the modulation measurements will take less time (i.e., less money) and give more information.
Does anyone know of any papers or research going on toward proving this?