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Re: Question on test scheme design for 4-port microstrip cir

时间:04-08 整理:3721RD 点击:
Dear all,

I designed a small four-port microstrip circuit (device under test), and obtained the simulation results. Since this 4-port microstrip circuit is very small, it does not have enough space for SMA connector mounting. Now I want (but I have no idea) to design a proper test scheme for purpose of the SMA-connector measurement of S parameters of this tiny four-port DUT by using four-port vector network analyzer. I really appreciate whatever help you could offer me on the test scheme design.

Thanks a lot.

Sincerely yours,
Kevin

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Added after 27 minutes:

By reading the de-embedding method with coupled line TRL calibration using four-port vector network analyzer, I designed a test scheme below. Any suggestions are greatly welcome. Thank you.

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Pictures are not uploaded properly.

Can you see them clearly? Thanks.


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