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High-performance CMOS current comparator
5270370 searchabstract Access The Full Text
Tang, X.; Pun, K.-P.;
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
This paper appears in: Electronics Letters
Issue Date : September 24 2009
Volume : 45 , Issue:20
On page(s): 1007 - 1009
ISSN : 0013-5194
Cited by : 2
INSPEC Accession Number: 10870768
Digital Object Identifier : 10.1049/el.2009.1419
Date of Current Version : 29 九月 2009
Sponsored by : Institution of Engineering and Technology
5270370 searchabstract Access The Full Text
Tang, X.; Pun, K.-P.;
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
This paper appears in: Electronics Letters
Issue Date : September 24 2009
Volume : 45 , Issue:20
On page(s): 1007 - 1009
ISSN : 0013-5194
Cited by : 2
INSPEC Accession Number: 10870768
Digital Object Identifier : 10.1049/el.2009.1419
Date of Current Version : 29 九月 2009
Sponsored by : Institution of Engineering and Technology
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