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求IEEE paper,谢谢!

时间:12-12 整理:3721RD 点击:
Analysis of A Bandgap Circuit DC Shift Caused by Substrate Noise Generated
by Power Switches
http://ieeexplore.ieee.org/Xplore/login.jsp?
url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F4097995%2F4097996%2F04098521.p
df%3Farnumber%3D4098521&authDecision=-203
Iven Zheng  Hongwei Zhao  Jian Yang  Weiying Li  Waley Li  Linpeng Wei  
Chuanzheng Wang  
Technol. Solution Organ., Freescale Semicond. Ltd.
This paper appears in: Solid-State and Integrated Circuit Technology, 2006.
ICSICT '06. 8th International Conference on
Issue Date: 23-26 Oct. 2006
On page(s): 1718 - 1720
Location: Shanghai
Print ISBN: 1-4244-0160-7
INSPEC Accession Number: 9408709
Digital Object Identifier: 10.1109/ICSICT.2006.306404
Date of Current Version: 02 四月 2007
ABSTRACT
This paper discusses the impact of the substrate noise generated by power
switches through common substrate in bandgap voltage reference circuits,
which have NPNs as main elements. It also analyzes how substrate noise
affects NPN device's performance and then makes output reference voltage dc
shifted in some types of bandgap circuit, which is a very fatal error in
system. This analysis method of bandgap dc shift is suitable for other
bandgap circuits in noisy substrate

Done.

 _of_A_Bandgap_Circuit_DC_Shift_Caused_by_Substrate_Noise.pdf

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