lumped elements

Hallo,

when measuring interdigial capacitors or printed inductors, how important
is the microstrip line's width of the contacts.
If I can deembed the line in post processing it should be without influence.
But how much S11 reflection is allowed to get still enough measuring power on the
capacitor or inductor.

I think of
interdigital_caps with width=50um and gap=50um
inductors with width=50um, gap=50um

I would contact it to a microstrip line with width=50, 100, 150 um.

Thanks for any reply

Hi
I think it's fundamental question
The s-parameters are exact if we have established what trans line connected to component and in what substrate component is placed
The using s-parameters measured on one substrate with one width of trl to model component behavior with another trl width produce errror due to component-trl coupling. We can not remove this error using step in width component simple!

But i dont know exact rule how to hand calculate the value of this error.

You can study this with momentum simulator.
Regards