DFT设计讨论
时间：10-02
整理：3721RD
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芯片设计时，Design for Test应该考虑那些
进入DFT的条件必须有一定的复杂度避免客户意外进入DFT模式
有点意思，也就是DFT不能影响正常工作，造成误触发的话可能会造成芯片出错
exactly. nomally we can pull a pin to -1V by connecting 2 diodes in series.
instead of forcing -1V, sinking currently out of the pin is feasible where in certain case, it's more stable especially data collection at low temperature.
DMF可测试性