关于BQ27742-G1的相关问题

我遇到的问题是：经过一段调试之后，发现BQ27742的CHG FET和DSG FET都被关闭了（就是FET1号管脚上都没与电压），于是我就配置FETTest( ): 0x74 and 0x75，高位赋值0x00,低位赋值0x83，然后执行STATR_FET_TEST，之后FETTest( ): 0x74 and 0x75的高位变成0x00,低位变成0x01。

相应的高位解释是：STATUS = The STATUS field indicates the status of the FET Test:
0xFF = Checksum error, the START_FET_TEST command was unsuccessful.
2-3 = START_FET_TEST command was successful with RECEN = 1.
FW is currently waiting for 2 seconds to elapse to remove the FW override applied to the selected FETs.
This field works like a countdown timer. It starts at 3 and counts down by 1 each second. When it reaches 1,
the FW override is removed and the selected FETs return to hardware control again.
1 = Either START_FET_TEST command was executed with RECEN = 1 and the selected FETs return to
hardware control,
or
START_FET_TEST command was executed with RECEN = 0 (selected FETs are in FW override state and
are opened).
不知道高位为什么是0x00.

强制打开mosfet的指令一般只在生产过程中做电气性能检测时才发送的，建议楼主用BQevsw或BQstudio软件去看一下此时电压的状态以及是否与相应的保护触发。谢谢！