MT6572 SIM2 test fails

[DESCRIPTION]
In CTA certification test, the feedback SIM card 2 fails;card 2 power-up sequence is incorrect.
CTA test case: 5.1.2 1.8V-3V fail
Test report:
Test summary: 5.1.2 1.8V-3V executed and FAILED.
FROM IT3 local log, it is in class B (3V) when cold reset timing is abnormal.
(class C (1.8V) when cold reset timing (1st cold reset) is correct)
Green is the class C (1.8V) ofcold reset timing (1st cold reset).
Red is the class B (3V) when cold reset timing is abnormal.
The abnormality in redis in the IO pulled after the clock as well as in the red after red circle diagram
is inside the red part; these are not correct.

Contrast measurement SIM1 / 2 ATR timing.
SIM1:

SIM2:

Measurement SIM2 ATR timing is abnormal.
In classB time (3V), SIM_IO2 also works in classC (1.8V) andcauses CTA test failure.
PMIC's SIM2_SIO/SIO2 ball name anti-fall results in SIM2 IO without the level shift andwithout the PMIC
level shift but is directly from the MT6572 output.

[SOLUTION]
Re-work HW. PMIC's SIM2_SIO/SIO2 ball name is Anti away and has to be corrected back.
MT6323 L11 <-> K11